@InProceedings{SilvaNetoArRoAnLiScBa:2023:DiStCh,
               author = "Silva Neto, Lauro Paulo and Arede, Rangel G. and Rossi, Jos{\'e} 
                         Osvaldo and Antonelli, Eduardo and Lima, Gustavo Nicolau de and 
                         Schamiloglu, Edl and Barroso, Joaquim Jos{\'e}",
          affiliation = "{Universidade Federal de S{\~a}o Paulo (UNIFESP)} and 
                         {Universidade Federal de S{\~a}o Paulo (UNIFESP)} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)} and {Universidade Federal 
                         de S{\~a}o Paulo (UNIFESP)} and {Instituto Nacional de Pesquisas 
                         Espaciais (INPE)} and {University of New Mexico} and {Instituto 
                         Nacional de Pesquisas Espaciais (INPE)}",
                title = "Dielectric strength characterization in BSZT ceramic capacitors",
            booktitle = "Proceedings...",
                 year = "2023",
         organization = "IEEE International Pulsed Power Conference",
            publisher = "IEEE",
             keywords = "ceramic capacitor, dielectric strength, Weibull, distribution.",
             abstract = "Ceramic capacitors are used in electronic devices that need a 
                         specific behavior or some project requirements such as temperature 
                         range, maximum voltage, dielectric strength, low loss, and others. 
                         In this work we synthesized ceramic capacitors using BSZT (Barium, 
                         Strontium, Zirconium, and Titanium) to be applied in Nonlinear 
                         Transmission Lines - NLTLs to produce high-power oscillations. In 
                         addition to sintering, we performed a dielectric strength 
                         characterization using ten samples and the Weibull distribution to 
                         determine the average dielectric strength and standard deviation. 
                         The results showed a ceramic material with dielectric strength of 
                         the order of 7.0 kV/mm and a standard deviation of +/- 1.2 
                         kV/mm.",
  conference-location = "San Antonio",
      conference-year = "25-29 June 2023",
                  doi = "10.1109/PPC47928.2023.10310956",
                  url = "http://dx.doi.org/10.1109/PPC47928.2023.10310956",
                 isbn = "979-835033233-9",
                 issn = "21584915",
             language = "en",
           targetfile = "
                         
                         Dielectric_strength_characterization_in_BSZT_ceramic_capacitors.pdf",
        urlaccessdate = "04 maio 2024"
}